Machinery Clamps,Metal Clamps,Metal Strap Clamp,Small Metal Clamps Ningbo Metal Sharing Supply Chain Management Co., Ltd , https://www.zenlesf.com
Picture from network
"Our sequencing parametric tests require the collection of millions of data points, and current leakage is usually at the pA level." said IMEC researcher Dr. Bart De Wachter, "Because of the high speed and LabVIEW system programming flexibility afforded by the PXI platform At the same time, the new NI PXI SMU helps us accurately measure low current signals."
Modular NI PXI SMU helps engineers build compact, parallel high-channel-count systems, delivering up to 68 SMU channels in a single PXI chassis, and scalable to hundreds of channels to meet wafer-level reliability and parallel test requirements . In addition, users can use the high-speed communication bus, deterministic hardware sequence generation, and digital control loop technology to customize the SMU response for any device under test to improve test throughput. Engineers can also control the SMU response in software, avoid waiting for the SMU to stabilize for a long time, and use the flexibility of the NI PXI SMU to minimize overshoot and ringing, even with highly capacitive loads.
"The increasing complexity of semiconductor devices requires us to rethink traditional methods of research, characterization, and wafer reliability measurement. This has been a key driver of our investment in PXI SMUs," said Luke Schreier, director of automated testing at NI. "The NI SMU has been reduced." Measured time, increased channel density, and now offers better measurement quality and sensitivity up to 10 fA.â€
The NI PXI SMU not only provides the ease-of-use of a desktop SMU, its interactive software front panel can also be used for basic measurement and debugging automation applications. The driver contains help files, documentation descriptions, and ready-to-run sample programs to aid in test code development and includes a programming interface that supports various development environments such as C, Microsoft .NET, and LabVIEW system design software. Engineers can also use NI PXI SMU with NI TestStand test management software to simplify the development and deployment of test systems in the lab or on the production floor.
(Original title: NI Releases Industry's Highest Accuracy PXI Source Measurement Unit New Low-Current SMU Offers Up to 10 fA Current Sensitivity)
NI Introduces New Source Measurement Unit for Industry's Highest Accuracy
Recently, NI (National Instruments, National Instruments, Inc.) as a supplier committed to providing engineers and scientists with solutions to meet the world's most serious engineering challenges, recently announced the launch of NI PXIe-4135. Source Measurement Unit (SMU) with a measurement sensitivity of 10 fA and output voltage up to 200V. Engineers can use the NI PXIe-4135 SMU to measure low-current signals and use the NI PXI SMU's high channel density, high-speed test throughput, and flexibility to implement wafer-level parametric testing, material research, and analysis of low-current sensors and integrated circuits. The features and other applications.